Ultrafast atomic force microscope offers unrivalled scan rate

Posted By : Barney Scott
Ultrafast atomic force microscope offers unrivalled scan rate

Keysight Technologies has announced an ultrafast-scanning 9500 atomic force microscope. The Keysight 9500 AFM system seamlessly integrates new software, a new high-bandwidth digital controller, and a state-of-the-art mechanical design to provide unrivaled scan rates of up to 2 sec/frame (256x256 pixels).

Engineered with scientific and industrial R&D users in mind, the 9500 is a suitable system for an expansive range of advanced AFM applications associated with materials science, life science, polymer science and electrical characterization.

The ultrafast scan rates of the 9500 atomic force microscope are made possible by Keysight's Quick Scan technology. Available as a system option, Quick Scan is controlled through NanoNavigator, a powerful imaging and analysis software package from Keysight. In addition to supporting Quick Scan functionality, NanoNavigator software lets researchers save time by using a new Auto Drive feature that automatically and optimally sets all parameters for the 9500.

AFM novices and experts alike can appreciate NanoNavigator's efficient workflow-based GUI as it guides users step-by-step through system setup and operation via intuitive, eye-catching visuals. For ultimate convenience, the NanoNavigator mobile app for smart phones and tablets allows remote monitoring of AFM experiments while they are being performed by the 9500.

The Keysight 9500 system offers a large (90µm) closed-loop AFM scanner with atomic resolution, industry-leading environmental control, ultra-high-precision temperature control, and much more. The 9500 delivers superior imaging in fluids, gases, and ambient conditions. Researchers also can use the 9500 to perform single-pass nanoscale electrical characterization. A new high-bandwidth, FPGA-based digital controller ensures high-speed operating precision and eliminates the requirement for additional external control boxes.

The compact mechanical design of the 9500 affords researchers quick and convenient access to their samples. More than a half-dozen of the most commonly used AFM imaging modes (including Keysight's patented MAC Mode) are supported by the system's standard nose cone, which can easily be interchanged with specialized nose cones as needed, extending the 9500's capabilities effortlessly. Keysight also offers an STM scanner for studies of conducting materials and an ILM system for simultaneous AFM/optical imaging.


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