Analyser opens door to advanced device characterisation

Posted By : Mick Elliott
Analyser opens door to advanced device characterisation

An analyser enabling a minimum of 100-pA level dynamic current measurements with a maximum of 200MHz bandwidth, 1GSa/s sampling rate and 14- or 16-bit wide dynamic range has been unveiled by Keysight Technologies. The CX3300 Series Device Current Waveform Analyser is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterisation and engineers working to reduce power/current consumption in low-power devices.

Characterising advanced devices and evaluating low-power devices are challenging tasks; onesthat require engineers to measure high-speed (over 1MHz) and low-level dynamic current (below 1μA).

However, the existing methodology for this measurement is plagued by many issues – a large noise, voltage drop, limited dynamic range, bandwidth – and as a result, low-level dynamic current often goes undetected and unmeasured. 

The new analyser overcomes this limitation by enabling the simultaneous measurement of wideband and low-level current waveforms.

By providing a 14-bit or 16-bit wide dynamic measurement range, a single instrument can meet a wide range of measurement requirements without using multiple instruments.

A graphical user interface on a WXGA 14.1in. multi-touch display, and advanced measurement and analysis software, make previously difficult low-level current waveform measurements and analyses dramatically efficient and easier to make.  

Using the CX3300 analyser, researchers can now measure transient current even if the pulse width is very narrow (less than 100 ns).

This capability is particularly beneficial for device engineers developing semiconductor or advanced memory devices, since it allows them to visualise previously unmeasurable waveforms.

Current consumption waveforms can also be clearly captured at any point in time, whether the device is in its sleep/standby or active state.

By being able to clearly see how a device consumes power, engineers are better able to quantitatively evaluate and reduce a device’s power /current consumption. 

The analyser can also be used as a debugging tool, enabling deep-dive and accurate evaluation during R&D.

Doing so, drastically increases R&D efficiency and accelerates the development process by shortening turn-around-time. Using the analyser, engineers are able to write more aggressive power consumption specifications, and in turn, realise more confident power reduction. 



You must be logged in to comment

Write a comment

No comments

View & download Keysight product literature, application notes, specifications & brochures.


View & download Keysight technical support documentation, demos, manuals & selection/configuration guides.


28th August 2018
Switzerland BERNEXPO-Site, Bern
European Microwave Week 2018
23rd September 2018
Spain Ifema Feria De Madrid
Connected World Summit 2018
25th September 2018
United Kingdom Printworks, London
IoT Solutions World Congress 2018
16th October 2018
Spain Barcelona
Engineering Design Show 2018
17th October 2018
United Kingdom Ricoh Arena, Coventry