Additional products & services

Displaying 41 - 45 of 45

MOI supports USB 2.0 connector, cable assembly test

MOI supports USB 2.0 connector, cable assembly test
Keysight Technologies has published its Method of Implmentation (MOI) document for USB 2.0 connector and cable assembly compliance testing using the ENA Series network analyser’s enhanced time domain analysis option (E5071C-TDR). Developed in the mid-1990s, the USB standard features a number of variants including SuperSpeed USB, also known as USB 3.0, which supports a 5 Gbps transfer rate and offers up to a 10 times performance increase over its predecessor USB 2.0 (Hi-Speed USB).
13th October 2014

DDR bus simulator addresses Bit Error Rate challenge

Keysight Technologies has introduced the DDR Bus Simulator; a tool that generates accurate Bit-Error-Rate (BER) contours for the JEDEC DDR memory bus specification. The software product, which is available as a new option for Advanced Design System (ADS) 2014.11 from Keysight EEsof EDA, quickly and accurately calculates DQ and DQS eye probability density distributions and BER contours for memory interfaces.
1st October 2014

Firmware option enhances high-speed digitisers

Firmware option enhances high-speed digitisers
Keysight Technologies has introduced new signal processing firmware for its family of U53xxA PCIe digitisers. The new firmware (option -TSR) allows simultaneous capture and transfer of acquired data in triggered applications. According to Keysight’s validation measures, the digitiser’s architecture, with the new firmware, is able to sustain triggered acquisitions of thousands of samples at hundreds of kHz rates without missing any events.
22nd September 2014


Femto/picoammeter, electrometer enhance R&D into new materials

Femto/picoammeter, electrometer enhance R&D into new materials
The B2980A Series of graphical femto/picoammeters and electrometers from Keysight Technologies can confidently measure down to 0.01fA which is 0.01 x 10-15A, and up to 10 petaohms (PΩ) which is 10 x 1015Ohms. In recent years, research and development into new materials, such as nanomaterial, graphene, polymers and dielectric material, has increased significantly.
2nd September 2014

Test suite helps improves power amplifer efficiency

Test suite helps improves power amplifer efficiency
Designed to help engineers improve PA efficiency through support for crest factor reduction (CFR), envelope tracking (ET) and digital pre-distortion (DPD) technologies, Keysight Technologies’ N7614B Signal Studio for Power Amplifier (PA) Test is an all-in-one, general-purpose test suite.
12th August 2014


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embedded world 2018
27th February 2018
Germany Nuremberg
Industry 4.0 Summit 2018
28th February 2018
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Factories of the Future Expo 2018
28th February 2018
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1st March 2018
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8th March 2018
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