Wireless test set showcased at Mobile World Congress

Posted By : Mick Elliott
Wireless test set showcased at Mobile World Congress

The latest features of the E7515A UXM wireless test set will be demonstrated by Keysight Technologies at Mobile World Congress in Barcelona (February 22-25).  The demonstration will feature LTE-A Pro end-to-end IP data throughput of 1Gbps using three component carriers, 4x4 and 2x2 downlink MIMO, and 256QAM downlink modulation.

Also on display is the UXM’s first-to-market benchtop support for five component carrier (5CC) data throughput and 1.6Gbps data rates via 4CC carrier aggregation and 4x4 downlink MIMO.

Along with increased data throughput rates, the UXM further enhances device performance verification with support for 8x2 and 8x4 downlink MIMO, up to four component carriers in a single test set (in two bands), and an integrated iPerf network throughput tool.

Design engineers working to ensure seamless coverage with high-quality voice and data services will find the UXM’s new enhanced VoLTE, WLAN calling/offload, dual-SIM test, and GSM/TD-SCDMA mobility features enable greater design confidence, on their benchtop.

The UXM now supports UE-to-UE VoLTE calls in a single test set, as well as integrated IMS server capabilities such as IMS logging and easier configuration of dedicated bearers.

Also available is WLAN calling and offload, to ensure WLAN-capable devices are able to transition smoothly between LTE-A and WLAN.

The addition of GSM/GPRS/EGPRS and TD-SCDMA/HSPA test applications allow one-box interRAT testing between LTE and 2G/3G, including PS handovers, CSFB, and SRVCC.

The UXM’s RF bench capabilities have also been expanded to reduce test time and cost of test with two-phone parallel RF test in a single UXM, one-box multi-format support including LTE/LTE-A, W-CDMA/HSPA+, TD-SCDMA/HSPA, and GSM/GPRS/EGPRS, as well as built-in CW interferers and the ability to change more connection parameters on the fly.

The UXM’s receiver test capabilities including flexible channel definition, frequency division duplex (FDD) and time division duplex (TDD) options, along with out-of-channel measurements and integrated fading enable extensive coverage of 3GPP test cases in a conformance benchtop solution.



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