5G, 802.11ad test solutions on parade in Washington

Posted By : Mick Elliott

A wide range of first-to-market design, test and characterisation solutions at will be showcased by Keysight Technologies at IEEE Globecom in Washington D.C. (Dec. 4 – 7). Keysight’s technical experts will demonstrate 5G Trial System Modelling and Validation, and show will show the pre-5G trial specification physical layer algorithmic library integrated into SystemVue. This solution provides a modelling reference for the Verizon 5G communication system designer.

A system for DPD testing on a multi-channel power amplifier assembly at 28GHz with a signal bandwidth of up to 2GHz will be demonstrated. This will be a key measurement requirement for active antenna systems aimed at the 5G, 28GHz frequency spectrum.

Also on show will be a wideband millimetre-wave waveform generation and analysis testbed reference solution that combines software and hardware to provide a flexible testbed with frequency coverage to 110GHz with a maximum analysis bandwidth of up to 5GHz.

The new E7760A wideband transceiver with integrated 802.11ad mmWave signal analysis and generation software will also be on parade alongside the NB-IoT Functional and RF Performance Test which is based on the E7515A UXM, and is used by chipset and device engineers implementing the cellular IoT technology NB-IoT based on 3GPP Release 13 standards.

On Tuesday, Dec. 6, Satish Dhanasekaran, vice president and general manager, Wireless Test Organisation, Keysight will present the keynote address titled “The Impact of New Spectrum on Design and Test”.

Dhanasekaran’s keynote will explore the impact of the new frontier of spectrum on design and technology as well as some of the emerging challenges to commercialising a mobile multiple-access network.

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