Digital Interconnect

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PCIe Test Solutions

Challenges for being successful with PCIe Gen 3 fall into two categories - physical layer validation and protocol layer validation. Get an overview of the test solutions available to help solve these challenges.
17th August 2015

PLTS software cuts fixture removal time by 75%

PLTS software cuts fixture removal time by 75%
Keysight Technologies has introduced N1930B Physical Layer Test System (PLTS) 2015, the latest release of its signal integrity test software for designing and validating high-speed digital interconnect. A key software enhancement in PLTS 2015 includes an N-port automatic fixture removal (AFR). This enhancement removes the effects of multiple test fixtures with a single step – reducing the error-correction time by 75% diwhen compared to other traditional error correction methods.
28th January 2015

ISI capability enhances high performance BERT

ISI capability enhances high performance BERT
Keysight Technologies has introduced adjustable and integrated intersymbol interference (ISI) capability for the J-BERT M8020A high-performance BERT. When engineers characterise and test high-speed digital receivers for compliance, they often need to emulate a certain channel loss. The new adjustable and programmable ISI function allows engineers to emulate channel loss.
22nd January 2015


FPGA development kit extends to high speed digitisers

FPGA development kit extends to high speed digitisers
Keysight Technologies has unveiled an updated version of its U5340A FPGA development kit. The new version allows for expanded deployment of on board IP signal processing across the full range of Keysight PCIe high-speed digitisers and the 12-bit AXIe 8-channel wideband digital receiver/digitiser.
11th January 2015


Digital Interconnect documents


View & download Keysight product literature, application notes, specifications & brochures.

Literature

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SPE Offshore Europe 2017
5th September 2017
United Kingdom Aberdeen Exhibition & Conference Centre
EPE 2017 ECCE Europe
11th September 2017
Poland Warsaw
ON Semiconductor Power Seminars 2017
11th September 2017
United Kingdom
DSEI 2017
12th September 2017
United Kingdom ExCeL, London
RWM 2017
12th September 2017
United Kingdom NEC, Birmingham