A Method of Implementation (MOI) guide for PCIe 3.0 Transmiiter/Receiver (Tx/Rx) Impedance and Return Loss Tests (Hot TDR/RL) using the ENA Series network analyser’s enhanced time domain analysis option (E5071C-TDR) has been produced by Keysight Technologies. The guide details procedures for time and frequency domain measurements and is used with a test package, such as Keysight’s state file, to simplify compliance testing and setup.
With the increase in bit rates, impedance matching has become all the more critical due to its significant impact on the eye diagram opening/closing.
One unique approach to overcoming this challenge is to evaluate the impedance of PCIe 3.0 active devices (Tx/Rx) under their power-on and operating state to quantify multiple reflection effects.
This hot TDR/hot return loss measurement provides engineers new insight into signal integrity issues and assures a device’s performance in multi-gigabit rates.
“Keysight MOIs are available for a number of different high-speed digital applications, such as USB, DisplayPort and Ethernet,” said Akira Nukiyama, vice president and general manager, Keysight’s Component Test Division, Kobe. “Our newest addition to this list, the PCIe 3.0 MOI, is just one more example of how we are working to give our customers the functionality they need to address any high-speed measurement challenge.”